• DocumentCode
    2102878
  • Title

    Development of molding compound for non-Antimony and non-Halogen

  • Author

    Iwasaki, Shinichi ; Ueda, Shigehisa

  • Author_Institution
    Electron. Device Mater. Lab., Sumitomo Bakelite Co. Ltd., Yokohama, Japan
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    1283
  • Lastpage
    1288
  • Abstract
    Recently, the growing concern of environmental issues are impacting the latest development trends for packaging materials in the semiconductor industry. Therefore, new compounds must not only suit the requirements of various package designs, but also be free of Antimony and Halogen so as not to raise any environmental concerns. In order to achieve the above concept, the following studies have been done against flammability as well as popcorn phenomena: 1. Resin structure analysis. 2. High filler loading by optimizing the particle´s size distribution of the filler system. 3. New flame retardant system instead of the current antimony and brominated epoxy combination. Through our studies, it is confirmed that the new flame retardant system and high filler loading are effective for flammability and popcorn phenomena. This new compound has UL-94 V-O antiflammability levels, as well as good performance in reliability, such as popcorn resistance and PCT, etc. In addition, it is confirmed that “High Temperature Storage Life (HTSL)” of this compound is superior to results of compounds utilizing the conventional anti-flammable agent methods of Antimony and Bromine. This technology can be applied to advanced compounds for next generation packages
  • Keywords
    encapsulation; environmental factors; filled polymers; flameproofing; packaging; PCT; UL-94 V-O antiflammability level; environmental factors; epoxy resin structure; filler loading; flame retardant system; flammability; high temperature storage life; molding compound; particle size distribution; popcorn phenomena; reliability; semiconductor packaging material; Electronics industry; Electronics packaging; Encapsulation; Fires; Flame retardants; Flammability; Resins; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606341
  • Filename
    606341