DocumentCode
2102958
Title
Theoretical aspects of GSAW and HVPSAW propagation properties for zinc oxide films on silicon carbide and correlation with experimental data
Author
Didenko, I.S. ; Hickernell, F.S. ; Naumenko, Natalya F.
Author_Institution
Moscow Steel & Alloys Inst., Russia
Volume
1
fYear
1999
fDate
17-20 Oct. 1999
Firstpage
313
Abstract
In this paper, the surface acoustic wave (SAW) propagation properties of sputtered zinc oxide (ZnO) films on single crystal silicon carbide (SiC) recently experimentally characterized are compared with the results of calculations based on published material data for SiC crystal and ZnO film. The two surface modes observed experimentally, a generalized SAW (GSAW) mode and a high velocity Pseudo-SAW (HVPSAW) mode, have been theoretically investigated with various values of the unknown elastic constant C13 of SiC within the interval permitted by the requirement of positive elastic energy in a crystal. For the GSAW mode, the calculated velocity dispersion was essentially insensitive to the value of C13 and consistent with the experimental data. For the HVPSAW mode, a good agreement between the calculated and measured leaky-wave propagation loss versus ZnO film thickness dependencies was observed when the SiC elastic constant C13 was taken near zero. The highest piezoelectric coupling of 5.2% has been theoretically predicted for the first GSAW mode and for the electrode configuration with the IDT at the film-substrate interface and metallized upper surface.
Keywords
II-VI semiconductors; elastic constants; semiconductor thin films; surface acoustic waves; zinc compounds; SiC; ZnO; elastic constant; film thickness; generalized SAW mode; high velocity pseudo-SAW mode; leaky-wave propagation loss; piezoelectric coupling; single crystal SiC substrate; sputtered films; surface acoustic wave propagation; velocity dispersion; Acoustic materials; Acoustic propagation; Acoustic waves; Crystalline materials; Loss measurement; Semiconductor films; Silicon carbide; Surface acoustic waves; Thickness measurement; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location
Caesars Tahoe, NV
ISSN
1051-0117
Print_ISBN
0-7803-5722-1
Type
conf
DOI
10.1109/ULTSYM.1999.849409
Filename
849409
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