• DocumentCode
    2102958
  • Title

    Theoretical aspects of GSAW and HVPSAW propagation properties for zinc oxide films on silicon carbide and correlation with experimental data

  • Author

    Didenko, I.S. ; Hickernell, F.S. ; Naumenko, Natalya F.

  • Author_Institution
    Moscow Steel & Alloys Inst., Russia
  • Volume
    1
  • fYear
    1999
  • fDate
    17-20 Oct. 1999
  • Firstpage
    313
  • Abstract
    In this paper, the surface acoustic wave (SAW) propagation properties of sputtered zinc oxide (ZnO) films on single crystal silicon carbide (SiC) recently experimentally characterized are compared with the results of calculations based on published material data for SiC crystal and ZnO film. The two surface modes observed experimentally, a generalized SAW (GSAW) mode and a high velocity Pseudo-SAW (HVPSAW) mode, have been theoretically investigated with various values of the unknown elastic constant C13 of SiC within the interval permitted by the requirement of positive elastic energy in a crystal. For the GSAW mode, the calculated velocity dispersion was essentially insensitive to the value of C13 and consistent with the experimental data. For the HVPSAW mode, a good agreement between the calculated and measured leaky-wave propagation loss versus ZnO film thickness dependencies was observed when the SiC elastic constant C13 was taken near zero. The highest piezoelectric coupling of 5.2% has been theoretically predicted for the first GSAW mode and for the electrode configuration with the IDT at the film-substrate interface and metallized upper surface.
  • Keywords
    II-VI semiconductors; elastic constants; semiconductor thin films; surface acoustic waves; zinc compounds; SiC; ZnO; elastic constant; film thickness; generalized SAW mode; high velocity pseudo-SAW mode; leaky-wave propagation loss; piezoelectric coupling; single crystal SiC substrate; sputtered films; surface acoustic wave propagation; velocity dispersion; Acoustic materials; Acoustic propagation; Acoustic waves; Crystalline materials; Loss measurement; Semiconductor films; Silicon carbide; Surface acoustic waves; Thickness measurement; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Caesars Tahoe, NV
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-5722-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1999.849409
  • Filename
    849409