Title :
When good diagnostics go bad - Why maturation is still hard
Author_Institution :
The Boeing Company
Keywords :
Aerospace testing; Context modeling; Costs; Degradation; Identity management systems; Impedance; Knowledge representation; Monitoring; System testing; Vehicles;
Conference_Titel :
Aerospace Conference, 2003. Proceedings. 2003 IEEE
Print_ISBN :
0-7803-7651-X
DOI :
10.1109/AERO.2003.1234157
