DocumentCode

2103107

Title

When good diagnostics go bad - Why maturation is still hard

Author

Wilmering, T.J.

Author_Institution

The Boeing Company

Volume

7

fYear

2003

fDate

March 8-15, 2003

Firstpage

3137

Lastpage

3147

Keywords

Aerospace testing; Context modeling; Costs; Degradation; Identity management systems; Impedance; Knowledge representation; Monitoring; System testing; Vehicles;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace Conference, 2003. Proceedings. 2003 IEEE

ISSN

1095-323X

Print_ISBN

0-7803-7651-X

Type

conf

DOI

10.1109/AERO.2003.1234157

Filename

1234157