• DocumentCode
    2103244
  • Title

    Simulation study of tunneling devices with quantum confinement in source and drain

  • Author

    Katayama, Y. ; Laux, S.E.

  • Author_Institution
    Tokyo Res. Lab., IBM, Kanagawa, Japan
  • fYear
    2004
  • fDate
    21-23 June 2004
  • Firstpage
    95
  • Abstract
    Tunneling devices being studied so far are mostly inter-band or resonant tunneling devices where discrete energy levels due to quantum confinement do not exist or exist only in the channel. Tunneling devices with quantum confinement in the source and drain (discrete energy levels there), such as coupled quantum well devices, are relatively new (A. Simmons et al., Tech. Dig. IEEE IEDM, pp. 755-758, 1997). We present self-consistent DC analyses of the electron transport in coupled quantum well systems through 2D computer simulation for the first time.
  • Keywords
    electrodes; quantum well devices; resonant tunnelling transistors; semiconductor device models; semiconductor quantum wells; tunnel transistors; 2D computer simulation; coupled quantum well devices; discrete energy levels; drain quantum confinement; electron transport; inter-band tunneling devices; resonant tunneling devices; self-consistent DC analyses; source quantum confinement; tunneling device simulation; Analytical models; Computer simulation; Electrons; Energy states; Frequency; Potential well; Quantum computing; Research and development; Resonant tunneling devices; Wave functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
  • ISSN
    1548-3770
  • Print_ISBN
    0-7803-8284-6
  • Type

    conf

  • DOI
    10.1109/DRC.2004.1367800
  • Filename
    1367800