Title :
Asynchronous high throughput NoC under high process variation
Author :
Ezz-Eldin, Rabab ; El-Moursy, Magdy A. ; Hamed, Hesham F. A.
Author_Institution :
Electron. Eng. Dept., Bani-suef Univ., Bani-suef, Egypt
Abstract :
Asynchronous NoC switch is proposed as a robust design to mitigate the impact of process variation. Asynchronous and synchronous network on chip design are implemented to evaluate the impact of process variation on the network throughput. Network on chip interconnects and clock distribution network are considered under process variation with the advance in technology. The variation in logic and interconnect are included to evaluate the delay and throughput variation with different technologies. The throughput negligibly decreases under high process variation conditions in asynchronous NoC switch, while rapidly decreases by up to 25% in synchronous design at the same variation conditions.
Keywords :
asynchronous circuits; clock distribution networks; integrated circuit design; integrated circuit interconnections; integrated circuit reliability; network-on-chip; switching circuits; asynchronous NoC switch; clock distribution network; high process variation; high throughput NoC; network throughput; network-on-chip interconnect; robust design; Clocks; Delays; Integrated circuit interconnections; Ports (Computers); Switches; Synchronization; Throughput; Asynchronous Design; Clock Skew; Interconnect; Network on Chip; Process Variation; Synchronous Design;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
Conference_Location :
Abu Dhabi
DOI :
10.1109/ICECS.2013.6815429