• DocumentCode
    2103495
  • Title

    Asynchronous high throughput NoC under high process variation

  • Author

    Ezz-Eldin, Rabab ; El-Moursy, Magdy A. ; Hamed, Hesham F. A.

  • Author_Institution
    Electron. Eng. Dept., Bani-suef Univ., Bani-suef, Egypt
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    361
  • Lastpage
    364
  • Abstract
    Asynchronous NoC switch is proposed as a robust design to mitigate the impact of process variation. Asynchronous and synchronous network on chip design are implemented to evaluate the impact of process variation on the network throughput. Network on chip interconnects and clock distribution network are considered under process variation with the advance in technology. The variation in logic and interconnect are included to evaluate the delay and throughput variation with different technologies. The throughput negligibly decreases under high process variation conditions in asynchronous NoC switch, while rapidly decreases by up to 25% in synchronous design at the same variation conditions.
  • Keywords
    asynchronous circuits; clock distribution networks; integrated circuit design; integrated circuit interconnections; integrated circuit reliability; network-on-chip; switching circuits; asynchronous NoC switch; clock distribution network; high process variation; high throughput NoC; network throughput; network-on-chip interconnect; robust design; Clocks; Delays; Integrated circuit interconnections; Ports (Computers); Switches; Synchronization; Throughput; Asynchronous Design; Clock Skew; Interconnect; Network on Chip; Process Variation; Synchronous Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
  • Conference_Location
    Abu Dhabi
  • Type

    conf

  • DOI
    10.1109/ICECS.2013.6815429
  • Filename
    6815429