Title :
A unified calibration algorithm for scattering and load pull measurement
Author :
Pisani, Umberto ; Ferrero, Andrea
Author_Institution :
Dipartimento di Elettronica, Torino Univ., Italy
Abstract :
A simple algorithm which unifies the calibration procedures for scattering and load pull measurements is proposed. The new technique is particularly useful when measuring non-insertable devices and for on-wafer characterizations. The algorithm was compared with other well established calibration techniques with very good results in terms of accuracy
Keywords :
S-parameters; calibration; measurement standards; microwave measurement; power measurement; accuracy; coaxial power sensor; load pull measurement; load pull measurements; microwave measurement; non-insertable devices; on-wafer characterization; scattering; unified calibration algorithm; Calibration; Coaxial components; Directional couplers; Error correction; Impedance; Measurement standards; Power measurement; Probes; Scattering parameters; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507571
