DocumentCode
2103640
Title
A unified calibration algorithm for scattering and load pull measurement
Author
Pisani, Umberto ; Ferrero, Andrea
Author_Institution
Dipartimento di Elettronica, Torino Univ., Italy
Volume
2
fYear
1996
fDate
1996
Firstpage
1250
Abstract
A simple algorithm which unifies the calibration procedures for scattering and load pull measurements is proposed. The new technique is particularly useful when measuring non-insertable devices and for on-wafer characterizations. The algorithm was compared with other well established calibration techniques with very good results in terms of accuracy
Keywords
S-parameters; calibration; measurement standards; microwave measurement; power measurement; accuracy; coaxial power sensor; load pull measurement; load pull measurements; microwave measurement; non-insertable devices; on-wafer characterization; scattering; unified calibration algorithm; Calibration; Coaxial components; Directional couplers; Error correction; Impedance; Measurement standards; Power measurement; Probes; Scattering parameters; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location
Brussels
Print_ISBN
0-7803-3312-8
Type
conf
DOI
10.1109/IMTC.1996.507571
Filename
507571
Link To Document