DocumentCode
2103885
Title
Comparative analysis of hot-phonon effects in nitride and arsenide channels for HEMTs
Author
Matulionis, A.
Author_Institution
Semicond. Phys. Inst., Vilnius, Lithuania
fYear
2004
fDate
21-23 June 2004
Firstpage
145
Abstract
The cutoff frequency of a transistor is determined mainly by gate length and electron drift velocity. In general, the velocity reaches high values in a two-dimensional electron gas channel (2DEG). Thus, a high electron mobility transistor (HEMT) with a 2DEG channel can operate at frequencies corresponding to short millimeter waves. Though the highest values of drift velocity are similar for electrons in nitride and arsenide 2DEG channels, the frequency performance of an arsenide HEMT is superior, as compared with nitride HEMTs. However, it is not straightforward to see why hot phonons do not limit drift velocity in arsenide 2DEG channels and, in this paper, a comparative analysis of hot-phonon effects in AlInAs/GaInAs/AlInAs/InP, AlGaN/GaN and AlGaN/AlN/GaN channels is carried out.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; hot carriers; indium compounds; phonons; two-dimensional electron gas; wide band gap semiconductors; 2DEG channel; AlGaN-AlN-GaN; AlGaN-GaN; AlInAs-GaInAs-AlInAs-InP; HEMT; electron drift velocity; gate length; high electron mobility transistor; hot-phonon effects; transistor cutoff frequency; two-dimensional electron gas channel; Electron emission; Electron mobility; Frequency; Gallium nitride; HEMTs; MODFETs; Phonons; Power supplies; Sun; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
Conference_Location
Notre Dame, IN, USA
ISSN
1548-3770
Print_ISBN
0-7803-8284-6
Type
conf
DOI
10.1109/DRC.2004.1367827
Filename
1367827
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