Title :
Behavior of Ag and ZnO thin films, deposited by thermal evaporation technique, as an optical filter
Author :
Dwivedi, V.K. ; Misra, K.P. ; Srivastava, Anurag ; Shukla, Ram Krishan ; Srivastava, Anurag
Author_Institution :
Dept. of Phys., Univ. of Lucknow, Lucknow
Abstract :
Interference filters are multilayer thin-film devices in which thin :layers of material have a thickness of the order of wavelength of light. Thin films of dielectrics as well as metals have been nice candidates for the purpose of interference filters for a long time. In the present paper thin films of silver and zinc oxide have been deposited by thermal evaporation technique on the glass substrate. The optical transmittance of these films as well as combinations of these films has been investigated thoroughly in the visible and near infrared region.
Keywords :
II-VI semiconductors; infrared spectra; interference filters; metallic thin films; optical multilayers; semiconductor thin films; semiconductor-metal boundaries; silver; vacuum deposition; visible spectra; wide band gap semiconductors; zinc compounds; Ag; Ag-ZnO; SiO2; ZnO; glass substrate; interference filters; near infrared transmittance; optical filter; optical transmittance; silver thin films; thermal evaporation technique; visible transmittance; zinc oxide thin films; Dielectric materials; Dielectric substrates; Dielectric thin films; Interference; Nonhomogeneous media; Optical films; Optical filters; Sputtering; Thin film devices; Zinc oxide; Ag; Interference Filter; Transmittance; ZnO;
Conference_Titel :
Advanced Optoelectronic Materials and Devices, 2008. AOMD 2008. 2nd National Workshop on
Conference_Location :
Varanasi
Print_ISBN :
978-0-230-63718-4