DocumentCode :
2104044
Title :
New structures for six-port reflectometers covering very large bandwidths
Author :
Hesselbarth, Jan ; Wiedmann, Frank ; Huyart, Bernard
Author_Institution :
Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1263
Abstract :
This paper presents two new structures for six-port reflectometers with very large operating bandwidths of more than three decades, using a combination of lumped reflectors and transmission lines. Circuits working over a range of 2-1300 MHz and 2-2200 MHz have been built using inexpensive passive surface mount elements and Schottky detector diodes. Comparing results obtained from the new proposed structures with those obtained from a commercial network analyzer show a worst case absolute value of 0.020 for the complex difference between the measured reflection coefficients. A convenient calibration procedure, for the entire band, is proposed using three standards and four approximately known loads
Keywords :
Schottky diodes; calibration; measurement standards; microwave detectors; microwave reflectometry; reflectometers; surface mount technology; 2 to 1300 MHz; 2 to 2200 MHz; Schottky detector diodes; calibration; lumped reflectors; measured reflection coefficients; network analyzer; operating bandwidths; passive surface mount elements; six-port reflectometers; transmission lines; Bandwidth; Calibration; Detectors; Distributed parameter circuits; Ear; Power measurement; Power transmission lines; Reflection; Schottky diodes; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507574
Filename :
507574
Link To Document :
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