Optimized sinewave test of waveform digitizers by a DFT approach

Author

Bertocco, Matteo ; Narduzzi, Claudio ; Petri, Dario

Author_Institution

Dipartimento di Elettronica e Inf., Padova Univ., Italy

Volume

2

fYear

1996

fDate

1996

Firstpage

1293

Abstract

The paper presents a particularly simple and effective DFT-based approach for digitizing waveform recorder testing. Its implementation is straightforward and signal processing requirements are confined to the calculation of the DFT, which can be carried out by a readily implemented fast Fourier transform algorithm. Adjustments to the test generator can be determined to ensure that tests are carried out under optimal conditions, providing accurate and reliable estimates of digitizer performance parameters

Keywords

analogue-digital conversion; automatic testing; compensation; digital storage oscilloscopes; discrete Fourier transforms; signal sampling; wave analysers; SNR; coherent sampling; digitizer performance parameters; digitizing sampling oscilloscope; effective DFT-based approach; fast Fourier transform algorithm; frequency compensation; frequency interpolation; optimized sinewave test; quasi-coherent sampling; sampling frequency; test generator; waveform digitizers; waveform recorder testing; Frequency estimation; Interpolation; Least squares approximation; Performance evaluation; Quantization; Sampling methods; Signal generators; Signal to noise ratio; Testing; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507580

Filename

507580