Dynamic testing of A/D converters: how many samples for a given precision?

The statistical analysis used for an ADC performance evaluation necessitates a finite number of samples N. The subject of our work is to optimize this value for a precision β with a given confidence interval ψ. Two different approaches were treated in the literature (deterministic or probabilistic). We consider in our case an intermediate approach based on the following concept: the jitter introduced by the ADC and the test bench, σ, influences the distribution of sampling. Consequently, the evaluation of N has to be reconsidered and will depend on the ratio defined by σ/T_re where T_re is the equivalent sampling period for a reconstructed signal. We also defined a generalized relation giving N as function of this ratio whatever the periodic input signal wave form. Simulations corroborate this study