Test and diagnosis of subranging A/D converters

Author

Boni, A. ; Chiorboli, G. ; Franco, G.

Author_Institution

Dipartimento di Ingegneria dell´´Inf., Parma Univ., Italy

Volume

2

fYear

1996

fDate

1996

Firstpage

1304

Abstract

A test methodology for linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that a sensible reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errors

Keywords

analogue-digital conversion; automatic testing; design for testability; error correction codes; fault diagnosis; integrated circuit modelling; integrated circuit testing; measurement errors; redundancy; signal sampling; ambiguity algorithm; coarse section testing; design for test; digital correction; fault model; fine section testing; integral nonlinearity errors; interstage offset correction; linear modeling; low prediction errors; measurement error; reduced number of test points; reduced physical model; redundancy; simulation; subranging A/D converters; test methodology; Analog-digital conversion; Clocks; Costs; Error analysis; Error correction; Logic testing; Predictive models; Production; Redundancy; Signal analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507582

Filename

507582