Nanotips characterization, modeling and simulation

Nanotips continue to be of crucial importance to Electron Microscopes, the sharpness of such nanotips plays a vital role in producing coherent electron and ion beams and hence improving the scanning resolution of these microscopes. Thus, a lot of research is being conducted to fabricate the ultimate sharp tip using Field Emission Microscope (FEM) and Field Ion Microscope (FIM). However, FEM and FIM micrographs show only a top view of the nanotip but do not reveal enough information about the overall tip geometry. In this paper, we present modeling and simulation methods that can help in obtaining more in-depth information about the overall tip shape.