DocumentCode :
2104444
Title :
Contrast mechanism of ultrasonic atomic force microscopy
Author :
Gao, Wenzhong ; Tittmann, B.R. ; Miyasaka, C.
Author_Institution :
Dept. of Eng. Sci. & Mech., Pennsylvania State Univ., University Park, PA, USA
Volume :
1
fYear :
1999
fDate :
17-20 Oct. 1999
Firstpage :
601
Abstract :
In this paper, ultrasonic atomic force microscopy (U-AFM) was examined both experimentally and theoretically as a source of a high definition visualization of the boundary between materials. Specifically, a sample of diffusion bonded steel-Cu-Si3N4 was vibrated at its first resonant frequency, f=133.43 kHz, and the boundaries were examined. The experimental results show that the contrast between materials can be measured accurately by the change in the elastic properties of the materials. Moreover, it was found that this method is superior to the standard atomic force microscope (AFM) topological measurements. Numerical simulation based on the finite element method (FEM) was also carried out and compared with the experiment results. In general, the theoretical results fit the experimental findings and strengthen the interpretation that the nature of the contrast between materials is highly dependant on the elasticity of the material. Furthermore, the amplitude images were shown to produce higher contrast than phase images.
Keywords :
acoustic microscopy; atomic force microscopy; elastic moduli; finite element analysis; ultrasonic transducers; amplitude images; contrast; contrast mechanism; elastic properties; finite element method; high definition visualization; resonant frequency; ultrasonic atomic force microscopy; Atomic force microscopy; Atomic measurements; Diffusion bonding; Elasticity; Finite element methods; Force measurement; Measurement standards; Numerical simulation; Resonant frequency; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
ISSN :
1051-0117
Print_ISBN :
0-7803-5722-1
Type :
conf
DOI :
10.1109/ULTSYM.1999.849471
Filename :
849471
Link To Document :
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