DocumentCode :
2104517
Title :
Application of wavelet based denoising techniques to rTMS evoked potentials
Author :
Chrapka, P. ; de Bruin, H. ; Hasey, G.
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
4736
Lastpage :
4739
Abstract :
This paper presents a new method of removing noise from the EEG response signal recorded during repetitive transcranial magnetic stimulation (rTMS). This noise is principally composed of the residual stimulus artifact and mV amplitude compound muscle action potentials recorded from the scalp muscles and precludes analysis of the cortical evoked potentials, especially during the first 15ms post stimulus. The method uses the wavelet transform with a fourth order Daubechies mother wavelet and a novel coefficient reduction algorithm based on cortical amplitude thresholds. The approach has been tested and two methods of coefficient reduction compared using data recorded during a study of cortical sensitivity to rTMS at different scalp locations.
Keywords :
electroencephalography; medical signal processing; signal denoising; transcranial magnetic stimulation; wavelet transforms; EEG response signal; coefficient reduction algorithm; compound muscle action potentials; cortical amplitude thresholds; cortical evoked potentials; fourth order Daubechies mother wavelet; rTMS evoked potentials; repetitive transcranial magnetic stimulation; residual stimulus artifact; scalp muscles; wavelet based denoising techniques; Electroencephalography; Muscles; Noise; Noise reduction; Wavelet analysis; Wavelet transforms; evoked potentials; muscle artifact; noise reduction; rTMS; Adult; Algorithms; Artifacts; Electroencephalography; Evoked Potentials, Motor; Female; Humans; Male; Motor Cortex; Reproducibility of Results; Sensitivity and Specificity; Transcranial Magnetic Stimulation; Wavelet Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6347025
Filename :
6347025
Link To Document :
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