The double-LNN calibration technique for scattering parameter measurements of microstrip devices

This paper presents an alternative way of a network analyzer calibration, in particular an in-fixture calibration. The new double-calibration technique employs the LNN calibration method on both sides of the device under test in order to perform an error-corrected in-fixture measurement. In general, with the double-calibration technique one can determine the corrected scattering parameter of a device under test without removing the device under test during the calibration process.