DocumentCode :
2104611
Title :
Optical Constants of Cd0.8Zn0.2S Thin Films from Transmission Spectrum
Author :
Di, Xia ; Sun, Zhen ; Li, Wei ; Feng, Lianghuan ; Zhang, Jingquan ; Wu, Lili ; Li, Bin ; Lei, Zhi
Author_Institution :
Coll. of Mater. Sci. & Eng., Sichuan Univ., Chengdu, China
fYear :
2010
fDate :
28-31 March 2010
Firstpage :
1
Lastpage :
4
Abstract :
Transmission spectrum of the Cd0.8Zn0.2S thin films prepared by vacuum evaporation, at normal incidence was obtained in the spectral region from 400 to 2000 nm. Based on the use of the maxima and minima of the interference fringes, a straightforward analysis proposed by Swanepoel´s method has been applied to derive the optical constants such as refractive index, n, absorption coefficients, a, optical band gap, Eg and the film thickness, d. The analysis of the optical absorption data revealed that the thin films were direct transition materials.
Keywords :
II-VI semiconductors; absorption coefficients; cadmium compounds; optical constants; refractive index; semiconductor thin films; vacuum deposition; wide band gap semiconductors; zinc compounds; Cd0.8Zn0.2S; Swanepoel method; absorption coefficients; interference fringes; normal incidence; optical band gap; optical constants; refractive index; thin films; transmission spectrum; vacuum evaporation; Absorption; Interference; Optical films; Optical materials; Optical refraction; Optical variables control; Photonic band gap; Refractive index; Transistors; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4812-8
Electronic_ISBN :
978-1-4244-4813-5
Type :
conf
DOI :
10.1109/APPEEC.2010.5448882
Filename :
5448882
Link To Document :
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