• DocumentCode
    2104611
  • Title

    Optical Constants of Cd0.8Zn0.2S Thin Films from Transmission Spectrum

  • Author

    Di, Xia ; Sun, Zhen ; Li, Wei ; Feng, Lianghuan ; Zhang, Jingquan ; Wu, Lili ; Li, Bin ; Lei, Zhi

  • Author_Institution
    Coll. of Mater. Sci. & Eng., Sichuan Univ., Chengdu, China
  • fYear
    2010
  • fDate
    28-31 March 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Transmission spectrum of the Cd0.8Zn0.2S thin films prepared by vacuum evaporation, at normal incidence was obtained in the spectral region from 400 to 2000 nm. Based on the use of the maxima and minima of the interference fringes, a straightforward analysis proposed by Swanepoel´s method has been applied to derive the optical constants such as refractive index, n, absorption coefficients, a, optical band gap, Eg and the film thickness, d. The analysis of the optical absorption data revealed that the thin films were direct transition materials.
  • Keywords
    II-VI semiconductors; absorption coefficients; cadmium compounds; optical constants; refractive index; semiconductor thin films; vacuum deposition; wide band gap semiconductors; zinc compounds; Cd0.8Zn0.2S; Swanepoel method; absorption coefficients; interference fringes; normal incidence; optical band gap; optical constants; refractive index; thin films; transmission spectrum; vacuum evaporation; Absorption; Interference; Optical films; Optical materials; Optical refraction; Optical variables control; Photonic band gap; Refractive index; Transistors; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4812-8
  • Electronic_ISBN
    978-1-4244-4813-5
  • Type

    conf

  • DOI
    10.1109/APPEEC.2010.5448882
  • Filename
    5448882