• DocumentCode
    2104840
  • Title

    Research on Multi-Class SVM Combining with LDA

  • Author

    Junjie Chen ; Wei Zhao ; Haifang Li

  • Author_Institution
    Coll. of Comput. & Software, Taiyuan Univ. of Technol., Taiyuan
  • fYear
    2008
  • fDate
    21-22 Dec. 2008
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    In recent years, multi-class SVM has been one of the hot spots for many researchers, and multi-class classification based on clustering is one of strategies. Because the information of class-labels is not considered by clustering, too much branches of the binary-tree are formed, especially in the case of samples in different classes having similar features. To solve the problem, linear discriminant analysis is introduced to binary-tree, the pretreatment that training samples before clustering is done to find optimal feature space in which the samples in the same classes will be gathered together, while the samples in different classes will be loosed, so binary-tree is optimized and the implementation of the algorithm is improved. The experiment is carried out on the UCI data sets. The results show that this method reduces the branches of binary-tree and improves the accuracy of the algorithm.
  • Keywords
    pattern classification; pattern clustering; support vector machines; trees (mathematics); LDA; UCI data sets; binary-tree; linear discriminant analysis; multiclass SVM; multiclass classification; support vector machine; Application software; Binary trees; Classification tree analysis; Clustering algorithms; Information technology; Linear discriminant analysis; Pattern recognition; Scattering; Support vector machine classification; Support vector machines; binary tree; fuzzy C-means clustering; linear discriminant analysis; multi-class classification; support vector machine;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology Application Workshops, 2008. IITAW '08. International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3505-0
  • Type

    conf

  • DOI
    10.1109/IITA.Workshops.2008.178
  • Filename
    4731956