Title :
Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
Author :
Giaquinto, N. ; Trotta, A.
Author_Institution :
Dept. of Electr. & Electron., Polytech. of Bari, Italy
Abstract :
A new sine-wave fitting algorithm for A/D converters testing is presented and discussed. The key feature of the algorithm is the possibility of using test signals with amplitude greater than the full-scale range of the device under test. The new technique, combined with an improved evaluation of the conversion noise via weighted mean square error, gives very accurate and repeatable estimates of the number of effective bits, which cannot be obtained by traditional methodologies. The performance of the new method is proved by means of computer simulations and experimental results as well
Keywords :
analogue-digital conversion; automatic testing; circuit analysis computing; circuit testing; curve fitting; digital simulation; parameter estimation; A/D converters testing; ADC testing; computer simulation; conversion noise; enhanced sine wave fitting algorithm; estimates; test signals; weighted mean square error; Analog-digital conversion; Computer simulation; Electronic equipment testing; Histograms; Legged locomotion; Mean square error methods; Performance evaluation; Signal to noise ratio; System testing; Transfer functions;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507604
