Title :
A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter
Author :
Schoukens, J. ; Pintelon, R. ; Vandersteen, G.
Author_Institution :
Dept. of ELEC, Vrije Univ., Brussels, Belgium
Abstract :
A method is proposed to characterize the nonlinear behaviour of a data acquisition channel using a sinewave fitting procedure. Three error sources are considered: the nonlinear (dynamic) behaviour of the data acquisition channel (amplifiers, sample-and-hold, analog-digital-convertor), the time base distortion and the time jitter. Also the time base distortion and the jitter variance are estimated from the same experiment
Keywords :
circuit analysis computing; curve fitting; data acquisition; electric distortion; electric distortion measurement; electronic equipment testing; harmonic analysis; jitter; stability; amplifiers; analog-digital-convertor; data acquisition channels; dynamic behaviour; error sources; nonlinear behaviour; sample-and-hold; sinewave fitting; time base distortion; time jitter; Additive noise; Data acquisition; Distortion measurement; Jitter; Noise measurement; Nonlinear filters; Power harmonic filters; Signal processing; Stochastic systems; Time measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507605
