Title :
Accuracy of effective bits estimation methods
Author :
Bertocco, M. ; Narduzzi, C. ; Paglierani, P. ; Petri, D.
Author_Institution :
Dipartimento di Elettronica e Inf., Padova Univ., Italy
Abstract :
The basic assumptions of ADC effective bits estimation procedures are analyzed in depth, and lower bounds to the achievable accuracy are derived. It is shown that such bounds depend on the ratio between the number of acquired samples of the input sinewave and the number of ADC quantization levels. The effect of broad-band noise superimposed on the input sinewave is also analyzed. Results are provided useful for the design of the estimation procedure itself
Keywords :
analogue-digital conversion; curve fitting; discrete Fourier transforms; error statistics; estimation theory; quantisation (signal); waveform analysis; ADC; DFT-based algorithms; SNR; achievable accuracy; confidence limits; deterministic quantization; effective bits estimation methods; fitting procedure; input sinewave; lower bounds; number of acquired samples; number of quantization levels; quantization error power; signal model; simulation; sine-fit algorithms; statistical efficiency; stochastic model; superimposed broadband noise effect; Algorithm design and analysis; Analog-digital conversion; Instruments; Performance evaluation; Quantization; Signal generators; Signal to noise ratio; Stochastic resonance; Testing; Yield estimation;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507606
