DocumentCode
2105113
Title
Hole mobility in organic single crystal field effect transistors
Author
Goldmann, C. ; Krellner, C. ; Pernstich, K.P. ; Haas, S. ; Gundlach, D.J. ; Batlogg, B.
Author_Institution
Lab. for Solid State Phys., Eidgenossische Tech. Hochschule, Zurich, Switzerland
fYear
2004
fDate
21-23 June 2004
Abstract
Summary form only given. Transport in organic molecular crystals (OMCs) is a topic of intense fundamental study. To access the transport properties of OMCs we make use of a field-effect device structure to accumulate a large sheet carrier density of holes at the crystal surface and fill trap states. Single crystal organic FETs were fabricated for this purpose. Using either a 2 or 4 terminal configuration, hole mobility greater than 10 cm/sup 2//Vs for rubrene and 1 cm/sup 2//Vs for tetracene and pentacene has been measured. The 4 terminal measurement allows the contact effects to be separated from the channel properties. We present the temperature dependence of the electrical characteristics and discuss the transport of the field-accumulated charge near the surface. Additionally, we report on complementary space-charge-limited-current measurements that reflect the bulk properties of the OMCs.
Keywords
field effect transistors; hole density; hole mobility; hole traps; organic semiconductors; space charge; FET hole mobility; OMC bulk properties; OMC transport properties; crystal surface sheet carrier density; electrical characteristics temperature dependence; field-accumulated charge transport; hole density; organic molecular crystals; organic single crystal FET; pentacene; rubrene; space-charge-limited-current; surface charge transport; tetracene; trap state filling; Charge carrier density; Charge carriers; Chemicals; Crystals; FETs; OFETs; Physics; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
Conference_Location
Notre Dame, IN, USA
ISSN
1548-3770
Print_ISBN
0-7803-8284-6
Type
conf
DOI
10.1109/DRC.2004.1367879
Filename
1367879
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