• DocumentCode
    2105113
  • Title

    Hole mobility in organic single crystal field effect transistors

  • Author

    Goldmann, C. ; Krellner, C. ; Pernstich, K.P. ; Haas, S. ; Gundlach, D.J. ; Batlogg, B.

  • Author_Institution
    Lab. for Solid State Phys., Eidgenossische Tech. Hochschule, Zurich, Switzerland
  • fYear
    2004
  • fDate
    21-23 June 2004
  • Abstract
    Summary form only given. Transport in organic molecular crystals (OMCs) is a topic of intense fundamental study. To access the transport properties of OMCs we make use of a field-effect device structure to accumulate a large sheet carrier density of holes at the crystal surface and fill trap states. Single crystal organic FETs were fabricated for this purpose. Using either a 2 or 4 terminal configuration, hole mobility greater than 10 cm/sup 2//Vs for rubrene and 1 cm/sup 2//Vs for tetracene and pentacene has been measured. The 4 terminal measurement allows the contact effects to be separated from the channel properties. We present the temperature dependence of the electrical characteristics and discuss the transport of the field-accumulated charge near the surface. Additionally, we report on complementary space-charge-limited-current measurements that reflect the bulk properties of the OMCs.
  • Keywords
    field effect transistors; hole density; hole mobility; hole traps; organic semiconductors; space charge; FET hole mobility; OMC bulk properties; OMC transport properties; crystal surface sheet carrier density; electrical characteristics temperature dependence; field-accumulated charge transport; hole density; organic molecular crystals; organic single crystal FET; pentacene; rubrene; space-charge-limited-current; surface charge transport; tetracene; trap state filling; Charge carrier density; Charge carriers; Chemicals; Crystals; FETs; OFETs; Physics; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
  • Conference_Location
    Notre Dame, IN, USA
  • ISSN
    1548-3770
  • Print_ISBN
    0-7803-8284-6
  • Type

    conf

  • DOI
    10.1109/DRC.2004.1367879
  • Filename
    1367879