• DocumentCode
    2105136
  • Title

    Studies on die-to-substrate interconnects for High-Q PCB inductors

  • Author

    Pourakbar, Mohammadreza ; Linton, Lance ; Rivet, Francois ; Faulkner, Michael

  • Author_Institution
    Coll. of Eng. & Sci., Victoria Univ., Melbourne, VIC, Australia
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    633
  • Lastpage
    636
  • Abstract
    Wire-bond, solder ball, and copper pillar are generally utilised as chip-to-substrate interconnects. In this paper, the impact of these types of connections on achievable quality factor of a planar inductor is investigated. A simple and accurate Pi-model of such joints, and mathematical expressions to estimate the model elements are proposed. Results show a good agreement between the model and the EM-simulation results, with inductance accuracy within 10%. At a frequency of 2GHz, simulation results demonstrate that an inductance of 1.26nH with a Q-factor of 154 is achievable on an organic laminate substrate. However, the Q-factor is reduced to 100 when such inductor is connected to a silicon chip via a solder bump flip-chip process. In order to implement and to achieve the required Q-factor, a practical design remedy is introduced.
  • Keywords
    Q-factor; flip-chip devices; inductors; integrated circuit interconnections; solders; EM-simulation; Pi-model; Q-factor; chip-to-substrate interconnects; die-to-substrate interconnects; frequency 2 GHz; high-Q PCB inductors; mathematical expressions; planar inductor; quality factor; silicon chip; solder ball; solder bump flip-chip process; wire-bond; Copper; Inductance; Inductors; Integrated circuit modeling; Q-factor; Resistance; Substrates; Copper pillar; Flip-chip; improved-Q; integrated circuit modelling; planar inductor; printed-circuit board; solder ball;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
  • Conference_Location
    Abu Dhabi
  • Type

    conf

  • DOI
    10.1109/ICECS.2013.6815494
  • Filename
    6815494