• DocumentCode
    2105331
  • Title

    Application of Quantum Neural Network Based on Rough Set in Transformer Fault Diagnosis

  • Author

    Ren Xianwen ; Zhang Feng ; Zheng Lingfeng ; Men Xianwen

  • Author_Institution
    Sch. of Electr. Eng., Northeast Dianli Univ. Jilin 132012, Jilin, China
  • fYear
    2010
  • fDate
    28-31 March 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    With the conception of quantum mechanics, quantum neural network has a fuzzy character, and the fuzzy and uncertain datas can be distributed to different patterns, through which the uncertainty of pattern recognition is decreased. In this paper, the classified effect of quantum neural network has been used in the fault diagnosis of transformer. Firstly, the parameter space is mapped to the fault state space rationally by updating the connection weights, and macroscopic information is collected by a classifier. Secondly, the renewed quantum intervals are smoothed, and the uncertain data can be related to different types with proper ratios, through which the accuracy of pattern recognition is improved. Through combing with rough set effectively, quantum neural network can improve the speed by reducing the redundant samples at the same time. Finally, the quantum neural network is compared with BP neural network in dealing with the actual examples, and the validity and feasibility has been proved.
  • Keywords
    fault diagnosis; fuzzy set theory; neural nets; pattern recognition; power engineering computing; power transformers; quantum computing; quantum theory; BP neural network; fault state space; fuzzy character; macroscopic information; quantum mechanics; quantum neural network; rough set; transformer fault diagnosis; Dissolved gas analysis; Fault diagnosis; Fuzzy neural networks; Neural networks; Pattern recognition; Power system reliability; Power transformers; Quantum mechanics; Set theory; Voltage transformers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4812-8
  • Electronic_ISBN
    978-1-4244-4813-5
  • Type

    conf

  • DOI
    10.1109/APPEEC.2010.5448911
  • Filename
    5448911