Exciton spectroscopic control of disordered semiconductor systems properties

Author

Areshkin, A.G. ; Vasil´eva, L.I. ; Fedorov, D.L.

Author_Institution

D.F. Ustinov Baltic State Tech. Univ. "Voenmech", St. Petersburg, Russia

fYear

2005

fDate

24-26 Aug. 2005

Firstpage

139

Lastpage

144

Abstract

The II-VI semiconductor solid solutions formed by binary compounds which have different crystal structures (wurtzite -W, zinc-blende - ZB and crystals with stacking faults - SF) have been investigated. Study of exciton reflection and luminescence spectra and birefringence measurements along with X-ray analysis and microprobe control have revealed for Zn_xCd_1-xSe and Zn_1-xMg_xS solid solutions the concentration range of the ZB-W structural phase transition. The dependence of band parameters on composition has been studied in a wide range of component concentrations covering both ZB and W pure structures, as well as the ZB-W transition region.

Keywords

II-VI semiconductors; X-ray analysis; birefringence; cadmium compounds; crystal structure; excitons; photoluminescence; selenium compounds; solid-state phase transformations; stacking faults; zinc compounds; II-VI semiconductor solid solutions; X-ray analysis; ZB-W structural phase transition; Zn_1-xMg_xS solid solutions; Zn_xCd_1-xSe; band parameters; binary compounds; birefringence measurements; component concentrations; crystal structures; exciton reflection; luminescence spectra; microprobe control; stacking faults; wurtzite; zinc-blende; Birefringence; Control systems; Crystals; Excitons; Luminescence; Phase measurement; Reflection; Spectroscopy; Stacking; Zinc;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Control, 2005. Proceedings. 2005 International Conference

Print_ISBN

0-7803-9235-3

Type

conf

DOI

10.1109/PHYCON.2005.1513966

Filename

1513966