Title :
Consistency and Validity of Self-reporting Scores in Stress Measurement Surveys
Author :
Masood, Khayyam ; Ahmed, Beena ; Jongyong Choi ; Gutierrez-Osuna, R.
Author_Institution :
Texas A&M Univ. at Qatar, Doha, Qatar
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Stress has been attributed to physiological and psychological demands that exceed the natural regulatory capacity of a person. Chronic stress is not only a catalyst for diseases such as hypertension, diabetes, insomnia but may also lead to social problems such as marriage breakups, suicide and violence. Objective assessment of stress is difficult so self-reports are commonly used to indicate the severity of stress. However, empirical information on the validity of self-reports is limited. The present study investigated the authenticity and validity of different self-report surveys. An analysis, based on a three-pronged strategy, was performed on these surveys. It was concluded that although subjects are prone to systematic error in reporting, self-reports can provide a useful substitute for data modeling specifically in stress evaluation where other objective assessments such as determination of stress using only physiological response are difficult.
Keywords :
biomedical measurement; diseases; measurement errors; medical disorders; chronic stress; data modeling; diabetes; diseases; empirical information; hypertension; insomnia; marriage breakups; natural regulatory capacity; physiological response; self-report surveys; self-reporting scores; stress measurement surveys; suicide; systematic error; three-pronged strategy; violence; Biomedical monitoring; Feature extraction; Heart rate variability; Monitoring; Physiology; Stress; Stress measurement; Data Collection; Data Interpretation, Statistical; Diagnostic Self Evaluation; Female; Humans; Male; Psychometrics; Reproducibility of Results; Sensitivity and Specificity; Stress, Psychological; Young Adult;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6347091