DocumentCode :
2105581
Title :
High performance 4H-SiC emitter coupled logic circuits
Author :
Singh, Sushil ; El Sayed, Nadim ; Elgabra, H. ; ElBoshra, Tamador ; Wahbah, Maisam ; Al Zaabi, Mohammed
Author_Institution :
Dept. of Electr. & Comput. Eng., Khalifa Univ. of Sci., Technol. & Res., Abu Dhabi, United Arab Emirates
fYear :
2013
fDate :
8-11 Dec. 2013
Firstpage :
703
Lastpage :
706
Abstract :
The increasing demand for electronic devices and circuits dedicated to harsh environment applications, specifically high temperature and high power applications, has called for more research dedicated towards silicon carbide (SiC) devices and integrated circuits (ICs). SiC, a wide bandgap semiconductor, is inherently capable of operation in such environments. SiC bipolar transistors are essential for such applications since bipolar devices, unlike MOSFETs, do not have any oxide layer under high electric field, and hence are not prone to reliability issues at high temperatures. In this paper, the design of optimized emitter coupled logic technology circuits using 4H-SiC bipolar transistors is presented. These circuits work over a wide range of temperatures and power supply voltages at high speeds, demonstrating the potential of robust high speed ECL integrated circuits in SiC.
Keywords :
III-V semiconductors; bipolar transistors; logic circuits; silicon compounds; wide band gap semiconductors; 4H emitter coupled logic circuits; SiC; bipolar devices; bipolar transistors; electronic circuits; electronic devices; harsh environment applications; high power applications; high temperature applications; integrated circuits; power supply voltages; robust high speed ECL IC; wide bandgap semiconductor; Logic gates; Noise; Propagation delay; SPICE; Silicon carbide; Temperature measurement; Transistors; High-temperature integrated circuits (ICs); emitter-coupled logic; high temperature; integrated circuits (ECL); silicon carbide (SiC); smart power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
Conference_Location :
Abu Dhabi
Type :
conf
DOI :
10.1109/ICECS.2013.6815511
Filename :
6815511
Link To Document :
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