Title :
Temporal evolution of seizure burden for automated neonatal EEG classification
Author :
Temko, Andriy ; Stevenson, Nathan ; Marnane, William ; Boylan, Geraldine ; Lightbody, G.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Coll. Cork, Cork, Ireland
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
The aim of this paper is to use recent advances in the clinical understanding of the temporal evolution of seizure burden in neonates with hypoxic ischemic encephalopathy to improve the performance of automated detection algorithms. Probabilistic weights are designed from temporal locations of neonatal seizure events relative to time of birth. These weights are obtained by fitting a skew-normal distribution to the temporal seizure density and introduced into the probabilistic framework of the previously developed neonatal seizure detector. The results are validated on the largest available clinical dataset, comprising 816.7 hours. By exploiting these priors, the ROC area is increased by 23% (relative) reaching 96.75%. The number of false detections per hour is decreased from 0.72 to 0.36, while maintaining the correct detection of seizure burden at 75%.
Keywords :
electroencephalography; medical disorders; medical signal detection; medical signal processing; paediatrics; signal classification; statistical distributions; automated detection algorithms; automated neonatal EEG classification; hypoxic ischemic encephalopathy; neonatal seizure detector; neonatal seizure event temporal location; probabilistic weights; seizure burden temporal evolution; skew normal distribution; Brain modeling; Detectors; Electroencephalography; Monitoring; Pediatrics; Probabilistic logic; Support vector machines; Algorithms; Artificial Intelligence; Diagnosis, Computer-Assisted; Female; Humans; Hypoxia-Ischemia, Brain; Infant, Newborn; Male; Pattern Recognition, Automated; Reproducibility of Results; Seizures; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6347096