DocumentCode
2105609
Title
Dynamic time warping based neonatal seizure detection system
Author
Ahmed, Rizwan ; Temko, Andriy ; Marnane, William ; Boylan, Geraldine ; Lighbody, G.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. Coll. Cork, Cork, Ireland
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
4919
Lastpage
4922
Abstract
Neonatal seizures patterns evolve with changing frequency, morphology and propagation. This study is an initial attempt to incorporate the characteristics of temporal evolution of neonatal seizures into our developed neonatal seizure detector. The previously designed SVM-based neonatal seizure detector is modified by substituting the Gaussian kernel with the Gaussian dynamic time warping kernel, to enable the SVM to classify variable length sequences of feature vectors of neonatal seizures. The preliminary results obtained compare favorably with the conventional SVM. The fusion of the two approaches is expected to improve the current state of the art neonatal seizure detection system.
Keywords
Gaussian processes; electroencephalography; feature extraction; medical disorders; medical signal detection; neurophysiology; signal classification; support vector machines; time warp simulation; vectors; EEG; Gaussian dynamic time warping kernel; conventional SVM; designed SVM-based neonatal seizure detector; dynamic time warping based neonatal seizure detection system; feature extraction; feature vectors; neonatal seizure temporal evolution; variable length sequence classification; Educational institutions; Electroencephalography; Feature extraction; Kernel; Pediatrics; Support vector machines; Vectors; Algorithms; Artificial Intelligence; Diagnosis, Computer-Assisted; Electroencephalography; Female; Humans; Infant, Newborn; Male; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Support Vector Machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6347097
Filename
6347097
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