Title :
Protection circuitry and time resolution in high frequency ultrasonic NDE
Author :
Chaggares, N.C. ; Tang, R.K. ; Sinclair, Anthony N. ; Foster, F. Stuart ; Haraieciwz, K. ; Starkoski, B.
Author_Institution :
Toronto Univ., Ont., Canada
Abstract :
Ultrasonic testing systems commonly employ voltage limiters to protect the display unit or pre-amp from the large pulses used to excite the transducers. These voltage limiters can seriously distort the shapes of echo signals, and degrade time resolution in signals centered above 30 MHz. The potential to avoid these problems by replacing the limiter with a fast high-voltage switching circuit is measured for two experimental systems.
Keywords :
field effect transistor switches; high-voltage techniques; overvoltage protection; power semiconductor switches; ultrasonic materials testing; MOSFET switch; echo signal shape distortion; excessive ringing; fast high-voltage switching circuit; high frequency ultrasonic NDE; protection circuitry; time resolution; voltage limiters; Circuit testing; Displays; Distortion; Frequency; Protection; Shape; Signal resolution; System testing; Ultrasonic transducers; Voltage;
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
Print_ISBN :
0-7803-5722-1
DOI :
10.1109/ULTSYM.1999.849522
