Title :
The sample complexity of worst-case identification of FIR linear systems
Author :
Dahleh, Munther A. ; Theodosopoulos, Theodore V. ; Tsitsiklis, John N.
Author_Institution :
Lab. for Inf. & Decision Syst., MIT, Cambridge, MA, USA
Abstract :
We consider the problem of identification of linear systems in the presence of measurement noise which is unknown but bounded in magnitude by some δ>0. We focus on the case of linear systems with a finite impulse response (FIR). It is known that the optimal identification error is related (within a factor of 2) to the diameter of a so-called uncertainty set and that the latter diameter is upper-bounded by 2δ, if a sufficiently long identification experiment is performed. If the identification error is measured with respect to the l1 norm, we establish that, for any K⩾1, the minimal length of an identification experiment that is guaranteed to lead to a diameter bounded by 2Kδ behaves like 2Nf(1/K), when N is large, where N is the length of the impulse response and f is a positive function known in closed form. We contrast this with identification in H∞, where an experiment of length O(N3) suffices. While the framework is entirely deterministic, our results are proved using probabilistic tools
Keywords :
computational complexity; error analysis; identification; linear systems; noise; optimisation; transient response; FIR linear systems; bounded noise; disturbance sets; finite impulse response; optimal identification error; sample complexity; uncertainty set; upper bound; worst-case identification; Chebyshev approximation; Finite impulse response filter; Frequency domain analysis; Integrated circuit noise; Laboratories; Length measurement; Linear systems; Noise measurement; Nonlinear systems; Uncertainty;
Conference_Titel :
Decision and Control, 1993., Proceedings of the 32nd IEEE Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-1298-8
DOI :
10.1109/CDC.1993.325566