DocumentCode
2106394
Title
Shock rejection & ambient temperature compensation mechanism for uncooled micocantilever thermal detector
Author
Tawfik, H.H. ; El-Gamal, Mourad N. ; Nabki, Frederic
Author_Institution
Electr. & Comput. Eng. Dept., McGill Univ., Montreal, QC, Canada
fYear
2013
fDate
8-11 Dec. 2013
Firstpage
827
Lastpage
830
Abstract
This paper presents a mechanism that involves the integration of a pixel blind to infrared (IR) radiation into a focal plane array (FPA) for thermal detection. The blind pixel serves as a reference capacitor while scanning the FPA active pixels. In harsh environment conditions (e.g. shocks and wide changes in ambient temperature), this mechanism yields down to a 0.83% percent error in the measured signal which is demonstrated here by simulations. The active and blind pixels design, fabrication process, and materials selection are discussed with the aid of finite element analysis.
Keywords
cantilevers; capacitors; compensation; finite element analysis; focal planes; infrared detectors; microfabrication; microsensors; temperature sensors; thermal shock; FPA; active pixel design; ambient temperature compensation mechanism; blind pixel design; fabrication process; finite element analysis; focal plane array; harsh environment conditions; infrared radiation detection; materials selection; reference capacitor; shock rejection; thermal detection; uncooled microcantilever thermal detector; Arrays; Capacitance; Detectors; Electric shock; Materials; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
Conference_Location
Abu Dhabi
Type
conf
DOI
10.1109/ICECS.2013.6815542
Filename
6815542
Link To Document