• DocumentCode
    2106394
  • Title

    Shock rejection & ambient temperature compensation mechanism for uncooled micocantilever thermal detector

  • Author

    Tawfik, H.H. ; El-Gamal, Mourad N. ; Nabki, Frederic

  • Author_Institution
    Electr. & Comput. Eng. Dept., McGill Univ., Montreal, QC, Canada
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    827
  • Lastpage
    830
  • Abstract
    This paper presents a mechanism that involves the integration of a pixel blind to infrared (IR) radiation into a focal plane array (FPA) for thermal detection. The blind pixel serves as a reference capacitor while scanning the FPA active pixels. In harsh environment conditions (e.g. shocks and wide changes in ambient temperature), this mechanism yields down to a 0.83% percent error in the measured signal which is demonstrated here by simulations. The active and blind pixels design, fabrication process, and materials selection are discussed with the aid of finite element analysis.
  • Keywords
    cantilevers; capacitors; compensation; finite element analysis; focal planes; infrared detectors; microfabrication; microsensors; temperature sensors; thermal shock; FPA; active pixel design; ambient temperature compensation mechanism; blind pixel design; fabrication process; finite element analysis; focal plane array; harsh environment conditions; infrared radiation detection; materials selection; reference capacitor; shock rejection; thermal detection; uncooled microcantilever thermal detector; Arrays; Capacitance; Detectors; Electric shock; Materials; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
  • Conference_Location
    Abu Dhabi
  • Type

    conf

  • DOI
    10.1109/ICECS.2013.6815542
  • Filename
    6815542