Title :
Efficient standard cell abutment checker
Author :
Juang-Ying Chueh ; Tung, Chuck
Author_Institution :
Design Methodology, Adv. Micro Devices Inc., Sunnyvale, CA, USA
Abstract :
An efficient and exhaustive standard-cell abutment verification tool is developed to ensure 100% layout verification coverage of design rule check (DRC) on boundaries created by standard-cell abutment during placement, Vt swap and ECO (engineering change orders). Several case-reduction techniques are presented to remove the redundancy of duplicate abutment. This methodology can achieve one order-of-magnitude reductions in the test area to exercise all boundaries created by all placement permutations in standard cell libraries.
Keywords :
application specific integrated circuits; integrated circuit design; integrated circuit testing; redundancy; DRC; ECO; Vt swap; case-reduction techniques; design rule check; engineering change orders; layout verification coverage; order-of-magnitude reductions; placement permutations; redundancy; standard cell libraries; standard-cell abutment verification tool; Application specific integrated circuits; Equations; Layout; Libraries; Rails; Routing; Standards;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
Conference_Location :
Abu Dhabi
DOI :
10.1109/ICECS.2013.6815547