• DocumentCode
    2106517
  • Title

    Efficient standard cell abutment checker

  • Author

    Juang-Ying Chueh ; Tung, Chuck

  • Author_Institution
    Design Methodology, Adv. Micro Devices Inc., Sunnyvale, CA, USA
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    847
  • Lastpage
    850
  • Abstract
    An efficient and exhaustive standard-cell abutment verification tool is developed to ensure 100% layout verification coverage of design rule check (DRC) on boundaries created by standard-cell abutment during placement, Vt swap and ECO (engineering change orders). Several case-reduction techniques are presented to remove the redundancy of duplicate abutment. This methodology can achieve one order-of-magnitude reductions in the test area to exercise all boundaries created by all placement permutations in standard cell libraries.
  • Keywords
    application specific integrated circuits; integrated circuit design; integrated circuit testing; redundancy; DRC; ECO; Vt swap; case-reduction techniques; design rule check; engineering change orders; layout verification coverage; order-of-magnitude reductions; placement permutations; redundancy; standard cell libraries; standard-cell abutment verification tool; Application specific integrated circuits; Equations; Layout; Libraries; Rails; Routing; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
  • Conference_Location
    Abu Dhabi
  • Type

    conf

  • DOI
    10.1109/ICECS.2013.6815547
  • Filename
    6815547