• DocumentCode
    2106715
  • Title

    Reliability-aware placement and fault tolerant reconfiguration in FPGAs

  • Author

    Lei Zhao ; Zulin Wang ; Lan Yang

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Beihang Univ., Beijing, China
  • fYear
    2012
  • fDate
    9-11 Nov. 2012
  • Firstpage
    541
  • Lastpage
    545
  • Abstract
    With various applications of reconfigurable devices in harsh or hostile remote environments, reliability becomes an important factor to evaluate system performance. In this paper, an approach is presented to improve the reliability of FPGA-based system through optimal spare placement and fault tolerant (FT) reconfiguration. In FPGA placement stage, high reliability of spare distribution is equivalent to optimal redundancy allocation problem. A modified Simulated-Annealing (SA) algorithm which incorporates reliability to optimization objective is applied to solve the allocation problem. Based on graph theory, a reliability evaluation method suitable for complex system is also given. When a fault is detected, a fault tolerant reconfiguration which selects the swapped spare with the least affection of reliability is introduced to recover the fault. Simulation results show that this approach improved reliability and achieved less average moves in reconfiguration.
  • Keywords
    fault tolerance; field programmable gate arrays; graph theory; reliability; simulated annealing; FPGA placement stage; FPGA- based system; allocation problem; fault tolerant reconfiguration; graph theory; hostile remote environments; modified simulated-annealing algorithm; optimal redundancy allocation problem; optimal spare placement; reconfigurable devices; reliability evaluation method; reliability-aware placement; spare distribution reliability; fault tolerance; placement; reconfiguration; reliability; spare allocation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Technology (ICCT), 2012 IEEE 14th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4673-2100-6
  • Type

    conf

  • DOI
    10.1109/ICCT.2012.6511410
  • Filename
    6511410