Title :
Uniformity of active region temperature and I-V curves
Author :
Yuan Miao ; Mia, Qinghai ; Shen, Zhiqi ; Dejun Zhang ; Xinghua Zhang ; Yang, Lieyong
Author_Institution :
ICIS, Nanyang Technol. Univ., Singapore
Abstract :
This paper finds out the errors of Fig. 23 and 24 of the IEC747-7 standard, proves the I-V characteristics curves of IEC747-7 standard does not accord with the objective rule in theory and experiment, and gives the correct figures
Keywords :
bipolar transistors; electric current measurement; integrated circuit measurement; measurement standards; temperature measurement; voltage measurement; I-V characteristics curves; IEC747-7 standard; active region temperature uniformity; bipolar transistors; experiment; junction temperature; objective rule; semiconductor chips; Circuit testing; Current measurement; Electrical resistance measurement; IEC standards; Measurement standards; Q measurement; Switches; Temperature; Thermal resistance; Voltage;
Conference_Titel :
Electrical and Computer Engineering, 2000 Canadian Conference on
Conference_Location :
Halifax, NS
Print_ISBN :
0-7803-5957-7
DOI :
10.1109/CCECE.2000.849577
