• DocumentCode
    2107015
  • Title

    An improved method based on UIOv for test sequence generation

  • Author

    Gu Juan ; Yuan Dong-ming ; Hu He-fei ; Gao Jin-Chun

  • Author_Institution
    Sch. of Electron. Eng., Beijing Univ. of Posts &Telecommun., Beijing, China
  • fYear
    2012
  • fDate
    9-11 Nov. 2012
  • Firstpage
    573
  • Lastpage
    577
  • Abstract
    There are many methods based on FSM(Finite State Machine) for conformance test. UIO(Unique Input/Output) and its improved method UIOv are the ones most widely used among them. The disadvantage of UIO is its low fault detection rate, UIOv is proposed to solve this problem. While UIOv possesses a longer test sequence. Several improvements on UIOv sequence generation and their shortages are described in details. In this paper, we suggested a new method which is based on these improvements. Our method takes the general communication protocols into account, a detailed algorithm process and conclusions combined with actual protocol are subsequently presented. Analysis showed that under a constant error detection rate, our method shortens the verification sequence length and the total sequence length effectively, besides, it is more conducive to programming.
  • Keywords
    automatic test pattern generation; conformance testing; error detection; finite state machines; formal verification; protocols; FSM; UIOv; communication protocol; conformance test; constant error detection rate; fault detection rate; finite state machine; test sequence generation; total sequence length; unique input-output; verification sequence length; UIO; communication protocol; conformance test; finite state machine; test sequence generation; verification sequence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communication Technology (ICCT), 2012 IEEE 14th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4673-2100-6
  • Type

    conf

  • DOI
    10.1109/ICCT.2012.6511424
  • Filename
    6511424