DocumentCode :
2107015
Title :
An improved method based on UIOv for test sequence generation
Author :
Gu Juan ; Yuan Dong-ming ; Hu He-fei ; Gao Jin-Chun
Author_Institution :
Sch. of Electron. Eng., Beijing Univ. of Posts &Telecommun., Beijing, China
fYear :
2012
fDate :
9-11 Nov. 2012
Firstpage :
573
Lastpage :
577
Abstract :
There are many methods based on FSM(Finite State Machine) for conformance test. UIO(Unique Input/Output) and its improved method UIOv are the ones most widely used among them. The disadvantage of UIO is its low fault detection rate, UIOv is proposed to solve this problem. While UIOv possesses a longer test sequence. Several improvements on UIOv sequence generation and their shortages are described in details. In this paper, we suggested a new method which is based on these improvements. Our method takes the general communication protocols into account, a detailed algorithm process and conclusions combined with actual protocol are subsequently presented. Analysis showed that under a constant error detection rate, our method shortens the verification sequence length and the total sequence length effectively, besides, it is more conducive to programming.
Keywords :
automatic test pattern generation; conformance testing; error detection; finite state machines; formal verification; protocols; FSM; UIOv; communication protocol; conformance test; constant error detection rate; fault detection rate; finite state machine; test sequence generation; total sequence length; unique input-output; verification sequence length; UIO; communication protocol; conformance test; finite state machine; test sequence generation; verification sequence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communication Technology (ICCT), 2012 IEEE 14th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4673-2100-6
Type :
conf
DOI :
10.1109/ICCT.2012.6511424
Filename :
6511424
Link To Document :
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