DocumentCode
2107015
Title
An improved method based on UIOv for test sequence generation
Author
Gu Juan ; Yuan Dong-ming ; Hu He-fei ; Gao Jin-Chun
Author_Institution
Sch. of Electron. Eng., Beijing Univ. of Posts &Telecommun., Beijing, China
fYear
2012
fDate
9-11 Nov. 2012
Firstpage
573
Lastpage
577
Abstract
There are many methods based on FSM(Finite State Machine) for conformance test. UIO(Unique Input/Output) and its improved method UIOv are the ones most widely used among them. The disadvantage of UIO is its low fault detection rate, UIOv is proposed to solve this problem. While UIOv possesses a longer test sequence. Several improvements on UIOv sequence generation and their shortages are described in details. In this paper, we suggested a new method which is based on these improvements. Our method takes the general communication protocols into account, a detailed algorithm process and conclusions combined with actual protocol are subsequently presented. Analysis showed that under a constant error detection rate, our method shortens the verification sequence length and the total sequence length effectively, besides, it is more conducive to programming.
Keywords
automatic test pattern generation; conformance testing; error detection; finite state machines; formal verification; protocols; FSM; UIOv; communication protocol; conformance test; constant error detection rate; fault detection rate; finite state machine; test sequence generation; total sequence length; unique input-output; verification sequence length; UIO; communication protocol; conformance test; finite state machine; test sequence generation; verification sequence;
fLanguage
English
Publisher
ieee
Conference_Titel
Communication Technology (ICCT), 2012 IEEE 14th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4673-2100-6
Type
conf
DOI
10.1109/ICCT.2012.6511424
Filename
6511424
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