DocumentCode
2107023
Title
Improved reliability model and optimal protective device placement in Micro Grid by Improved Binary Particle Swarm Optimization
Author
Prommee, W. ; Pongprapunt, N. ; Ongsakul, W.
Author_Institution
Electr. Eng. Dept., Rajamangala Univ. of Technol. Lanna, Chiang Rai, Thailand
fYear
2011
fDate
May 30 2011-June 3 2011
Firstpage
1514
Lastpage
1519
Abstract
This paper presents improved mathematical reliability model for optimal protective devices placement in Micro Grid (MG). The objective is to improve calculation for System Average Interruption Frequency Index (SAIFI), System Average Interruption Duration Index (SAIDI), and Total Cost (TC) including Fix Cost of device investment, Cost of permanent interruption, and temporary interruption. SAIFI, SAIDI, and TC are minimized by Improved Binary Particle Swarm Optimization (IBPSO). For single objective optimization problems, Binary PSO is improved by balance sigmoid function. Results show that the given number of distributed generation (DG) and optimal protective devices placement including reclosers, switches, and fuses can increase reliability and decrease the frequency, duration, and cost of interruption in MG system.
Keywords
particle swarm optimisation; power grids; power system protection; power system reliability; power system simulation; distributed generation; improved binary particle swarm optimization; mathematical reliability model; microgrid; optimal protective device placement; optimal protective devices; system average interruption duration index; system average interruption frequency index; total cost; Equations; Fuses; Mathematical model; Optimization; Particle swarm optimization; Reliability; Switches; Micro grid; Reliability model; binary particle swarm optimization; protective device;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
Conference_Location
Jeju
ISSN
2150-6078
Print_ISBN
978-1-61284-958-4
Electronic_ISBN
2150-6078
Type
conf
DOI
10.1109/ICPE.2011.5944494
Filename
5944494
Link To Document