DocumentCode :
2107058
Title :
Image-position Technology of the Digital Circuit Fault Diagnosis Based on Lab Windows/CVI
Author :
Su Wei ; Liu Ying ; Dong Nanping
Author_Institution :
Coll. of Autom., Beijing Union Univ., Beijing
fYear :
2008
fDate :
21-22 Dec. 2008
Firstpage :
744
Lastpage :
748
Abstract :
This paper presents the different methods and processes of the implement of image-positioning technique, by which the user can locate the probe quickly and accurately during the process of circuit-fault diagnosis. The article introduces the fault diagnosis program that can retrieve information from fault dictionary, presents the image-position technique of BMP and PCB and proposes the usage of the significant function and controls are given which can used to locate the probe accurately. During the test, the real circuit graph guides the user and points out the fault location, thus raising the efficiency of fault removal.
Keywords :
digital integrated circuits; fault simulation; image processing; integrated circuit testing; BMP; Lab Windows/CVI; PCB; circuit graph; digital circuit fault diagnosis; fault location; fault removal; image-position technology; Circuit faults; Circuit testing; Digital circuits; Displays; Fault diagnosis; Fault location; Instruments; Probes; Programming; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology Application Workshops, 2008. IITAW '08. International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3505-0
Type :
conf
DOI :
10.1109/IITA.Workshops.2008.123
Filename :
4732044
Link To Document :
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