Title :
Design techniques and analysis of high-resolution neural recording systems targeting epilepsy focus localization
Author :
Shoaran, Mahsa ; Pollo, Claudio ; Leblebici, Yusuf ; Schmid, A.
Author_Institution :
Microelectron. Syst. Lab., Swiss Fed. Inst. of Technol. (EPFL), Lausanne, Switzerland
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
The design of a high-density neural recording system targeting epilepsy monitoring is presented. Circuit challenges and techniques are discussed to optimize the amplifier topology and the included OTA. A new platform supporting active recording devices targeting wireless and high-resolution focus localization in epilepsy diagnosis is also proposed. The post-layout simulation results of an amplifier dedicated to this application are presented. The amplifier is designed in a UMC 0.18μm CMOS technology, has an NEF of 2.19 and occupies a silicon area of 0.038 mm2, while consuming 5.8 μW from a 1.8-V supply.
Keywords :
biomedical electronics; electroencephalography; medical disorders; medical signal processing; neurophysiology; operational amplifiers; optimisation; patient diagnosis; patient monitoring; EEG; OTA; UMC CMOS technology; amplifier topology; circuit challenges; design analysis; design techniques; epilepsy diagnosis; high-density neural recording system targeting epilepsy monitoring; high-resolution focus localization; high-resolution neural recording systems targeting epilepsy focus localization; optimization; post-layout simulation; power 5.8 muW; size 0.18 mum; supporting active recording devices; voltage 1.8 V; wireless focus localization; Capacitors; Electrodes; Epilepsy; Noise; Resistors; Topology; Transistors; Amplifiers, Electronic; Brain; Electroencephalography; Epilepsy; Equipment Design; Equipment Failure Analysis; Humans; Microelectrodes; Monitoring, Ambulatory; Nerve Net; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Wireless Technology;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6347153
