• DocumentCode
    2107328
  • Title

    Finding focused itemsets from software defect data

  • Author

    Zafar, Haseeb ; Rana, Z. ; Shamail, Shafay ; Awais, Mian M.

  • Author_Institution
    Sch. of Sci. & Eng., Dept. of Comput. Sci., LUMS, Lahore, Pakistan
  • fYear
    2012
  • fDate
    13-15 Dec. 2012
  • Firstpage
    418
  • Lastpage
    423
  • Abstract
    Software product measures have been widely used to predict software defects. Though these measures help develop good classification models, studies propose that relationship between software measures and defects still needs to be investigated. This paper investigates the relationship between software measures and the defect prone modules by studying associations between the two. The paper identifies the critical ranges of the software measures that are strongly associated with defects across five datasets of PROMISE repository. The paper also identifies the ranges of the measures that do not necessarily contribute towards defects. These results are supported by information gain based ranking of software measures.
  • Keywords
    data mining; pattern classification; software reliability; PROMISE repository; classification model; focused itemset; information gain based ranking; software defect data; software defect prediction; software measure; software product measure; Association mining; Metrics/Measurement; Product metrics; Software Quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multitopic Conference (INMIC), 2012 15th International
  • Conference_Location
    Islamabad
  • Print_ISBN
    978-1-4673-2249-2
  • Type

    conf

  • DOI
    10.1109/INMIC.2012.6511437
  • Filename
    6511437