Title :
Estimating correlation for a real-time measure of connectivity
Author :
Arunkumar, Akhil ; Panday, A. ; Joshi, B. ; Ravindran, Ajith ; Zaveri, H.P.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
There has recently been considerable interest in connectivity analysis of fMRI and scalp and intracranial EEG time-series. The computational requirements of the pair-wise correlation (PWC), the core time-series measure used to estimate connectivity, presents a challenge to the real-time estimation of the PWC between all pairs of multiple time-series. We describe a parallel algorithm for computing PWC in real-time for streaming data from multiple channels. The algorithm was implemented on the Intel Xeon™ and IBM Cell Broadband Engine™ platforms. We evaluated time to estimate correlation for signals recorded with different acquisition parameters as a comparison to real-time constraints. We demonstrate that the execution time of these efficient implementations meet real-time constraints in most instances.
Keywords :
biomedical MRI; correlation methods; electroencephalography; medical signal processing; real-time systems; time series; IBM Cell Broadband Engine Platforms; Intel Xeon; PWC computing; connectivity real-time measure estimation correlation; core time-series measure; fMRI; intracranial EEG time-series; multiple time-series; pair-wise correlation; parallel algorithm; real-time constraints; scalp; signal estimate correlation; streaming data; Broadband communication; Correlation; Electroencephalography; Engines; Kernel; Real-time systems; Scalp; EEG; IBM Cell Broadband Engine; Intel Xeon; Intracranial EEG; MRI; Pair-Wise Correlation; Real-time; fMRI; Algorithms; Brain; Brain Mapping; Computer Systems; Connectome; Humans; Magnetic Resonance Imaging; Nerve Net; Reproducibility of Results; Sensitivity and Specificity; Statistics as Topic;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6347163