• DocumentCode
    2107392
  • Title

    Correlation between intra- and extracranial background EEG

  • Author

    Duun-Henriksen, Jonas ; Kjaer, Troels W. ; Madsen, R.E. ; Remvig, L.S. ; Thomsen, C.E. ; Sorensen, Helge Bjarup Dissing

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    5198
  • Lastpage
    5201
  • Abstract
    Scalp EEG is the most widely used modality to record the electrical signals of the brain. It is well known that the volume conduction of these brain waves through the brain, cerebrospinal fluid, skull and scalp reduces the spatial resolution and the signal amplitude. So far the volume conduction has primarily been investigated by realistic head models or interictal spike analysis. We have set up a novel and more realistic experiment that made it possible to compare the information in the intra- and extracranial EEG. We found that intracranial EEG channels contained correlated patterns when placed less than 30 mm apart, that intra- and extracranial channels were partly correlated when placed less than 40 mm apart, and that extracranial channels probably were correlated over larger distances. The underlying cortical area that influences the extracranial EEG is found to be up to 45 cm2. This area is larger than previously reported.
  • Keywords
    correlation methods; electroencephalography; brain; cerebrospinal fluid; correlation; extracranial background EEG; interictal spike analysis; intracranial background EEG; scalp EEG; signal amplitude; skull; spatial resolution; volume conduction; Brain models; Correlation; Electrodes; Electroencephalography; Scalp; Strips; Algorithms; Brain; Brain Mapping; Connectome; Electroencephalography; Humans; Nerve Net; Reproducibility of Results; Sensitivity and Specificity; Statistics as Topic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6347165
  • Filename
    6347165