Title :
Detection of spectrally equivalent parametric processes using higher order statistics
Author :
Coulon, Martial ; Tourneret, Jean-Yves ; Swami, Ananthram
Author_Institution :
ENSEEIHT, Toulouse, France
Abstract :
The paper addresses the problem of detecting two spectrally equivalent parametric processes (SEPP): the noisy AR process and the ARMA process. Higher-order statistics (HOS) are shown to be effective for detection. Two HOS based detectors are derived and compared. The fist detector studies the singularity of a HOS-based Yule-Walker matrix. The second detector filters the data by an AR filter estimated from the data; the residual HOS are then shown to be effective for the SEPP detection problem
Keywords :
FIR filters; autoregressive moving average processes; autoregressive processes; higher order statistics; noise; signal detection; AR filter; ARMA process; HOS-based Yule-Walker matrix; higher order statistics; noisy AR process; spectrally equivalent parametric processes; spectrally equivalent process; Additive noise; Detectors; Filters; Higher order statistics; Maximum likelihood detection; Milling machines; Parametric statistics; Powders; Signal processing; Testing;
Conference_Titel :
Acoustics, Speech and Signal Processing, 1998. Proceedings of the 1998 IEEE International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4428-6
DOI :
10.1109/ICASSP.1998.681572