DocumentCode :
2107732
Title :
Frequency changes in aerodynamically excited resonating micromachined beams
Author :
Wylde, J. ; Wilke, R. ; Hubbard, T.
Author_Institution :
Mech. Eng. Dept., Dalhousie Univ., Halifax, NS, Canada
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
961
Abstract :
The resonant frequency of micromachined structures is primarily dependent upon the mass and stiffness of the device. This paper examines some of the second-order effects that may affect the resonant frequency of micromachined beams. A series of clamped-clamped micromachined beams were fabricated using a standard CMOS process with wet chemical etch postprocessing. The beams were aerodynamically excited using compressed air and the oscillations of the beams were optically measured using a non-contact laser reflectance system. The measured resonance frequency of the beams decreased with decreasing width. The measured frequencies were as high as 42 kHz and the change in frequency was as large as 25%
Keywords :
micromechanical resonators; CMOS process; aerodynamically excited resonating micromachined beams; clamped-clamped micromachined beams; frequency changes; micromachined structures; noncontact laser reflectance system; second-order effects; wet chemical etch postprocessing; CMOS process; Chemical lasers; Chemical processes; Frequency measurement; Laser beams; Laser excitation; Optical beams; Reflectivity; Resonant frequency; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 2000 Canadian Conference on
Conference_Location :
Halifax, NS
ISSN :
0840-7789
Print_ISBN :
0-7803-5957-7
Type :
conf
DOI :
10.1109/CCECE.2000.849608
Filename :
849608
Link To Document :
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