• DocumentCode
    2107732
  • Title

    Frequency changes in aerodynamically excited resonating micromachined beams

  • Author

    Wylde, J. ; Wilke, R. ; Hubbard, T.

  • Author_Institution
    Mech. Eng. Dept., Dalhousie Univ., Halifax, NS, Canada
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    961
  • Abstract
    The resonant frequency of micromachined structures is primarily dependent upon the mass and stiffness of the device. This paper examines some of the second-order effects that may affect the resonant frequency of micromachined beams. A series of clamped-clamped micromachined beams were fabricated using a standard CMOS process with wet chemical etch postprocessing. The beams were aerodynamically excited using compressed air and the oscillations of the beams were optically measured using a non-contact laser reflectance system. The measured resonance frequency of the beams decreased with decreasing width. The measured frequencies were as high as 42 kHz and the change in frequency was as large as 25%
  • Keywords
    micromechanical resonators; CMOS process; aerodynamically excited resonating micromachined beams; clamped-clamped micromachined beams; frequency changes; micromachined structures; noncontact laser reflectance system; second-order effects; wet chemical etch postprocessing; CMOS process; Chemical lasers; Chemical processes; Frequency measurement; Laser beams; Laser excitation; Optical beams; Reflectivity; Resonant frequency; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2000 Canadian Conference on
  • Conference_Location
    Halifax, NS
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-5957-7
  • Type

    conf

  • DOI
    10.1109/CCECE.2000.849608
  • Filename
    849608