DocumentCode :
2107778
Title :
Reduced semiconductor three-level interline dynamic voltage restorer
Author :
Zhang, Lei ; Loh, Poh Chang ; Gao, Feng ; Frede, Blaabjerg
Author_Institution :
Sch. of Electron. & Electr. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2011
fDate :
May 30 2011-June 3 2011
Firstpage :
1843
Lastpage :
1847
Abstract :
The previously proposed Interline Dynamic Voltage Restorer (IDVR) system enhances its capability to compensate for long-term and deep voltage sags from propagating to critical loads in power system without requiring a bulky energy storage device. By having multiple DVRs connected to different transmission feeders, the common energy storage in IDVR system can be dynamically replenished from an unaffected feeder so as to maintain the rated power of critical loads in another feeder where voltage sag appears. However, despite its enhancement in compensation capability, the drawbacks faced by original IDVR system are mainly attributed to its complexity in topology and underutilizations of semiconductors. Aimed to improve the system in these aspects, the paper proposes a new IDVR topology with 25% reduction in semiconductors totally used. The theoretical analysis and its operating principles are also presented. In addition, some constraints faced by this new system are also noted. Finally, simulation results are given to validate the feasibility of proposed topology.
Keywords :
power supply quality; power transmission; IDVR system; IDVR topology; common energy storage; compensation capability enhancement; power system; semiconductor reduction; semiconductor underutilizations; theoretical analysis; three-level interline dynamic voltage restorer; transmission feeders; voltage sags; Power quality; Power system dynamics; Rails; Reactive power; Topology; Voltage control; Voltage fluctuations; Dynamic voltage restorer (DVR); nine-switch converter; phase advance; power quality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and ECCE Asia (ICPE & ECCE), 2011 IEEE 8th International Conference on
Conference_Location :
Jeju
ISSN :
2150-6078
Print_ISBN :
978-1-61284-958-4
Electronic_ISBN :
2150-6078
Type :
conf
DOI :
10.1109/ICPE.2011.5944520
Filename :
5944520
Link To Document :
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