DocumentCode
2107793
Title
Circuit yield of organic integrated electronics
Author
Cantatore, E. ; Hart, C.M. ; Digioia, M. ; Gelinck, G.H. ; Geuns, T.C.T. ; Huitema, H.E.A. ; Schrijnemakers, L.R.R. ; van Veenendaal, E. ; de Leeuw, D.M.
Author_Institution
Philips Res., Eindhoven, Netherlands
fYear
2003
fDate
13-13 Feb. 2003
Firstpage
382
Abstract
Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.
Keywords
digital integrated circuits; integrated circuit yield; organic semiconductors; circuit yield; digital circuit; organic integrated electronics; organic transistor; reliability; Circuit faults; Digital circuits; Electrodes; Flexible printed circuits; Insulation; Integrated circuit interconnections; Integrated circuit yield; Organic semiconductors; Polymer films; Semiconductor films;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. 2003 IEEE International
Conference_Location
San Francisco, CA, USA
ISSN
0193-6530
Print_ISBN
0-7803-7707-9
Type
conf
DOI
10.1109/ISSCC.2003.1234346
Filename
1234346
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