DocumentCode :
2108296
Title :
Dynamic Simulation Of Multiple Trapping Processes And Anomalous Frequency Dependence In GaAs MESFETs
Author :
Ho, Shirun ; Oohira, Masaki ; Kagaya, Osamu ; Moriyoshi, Aya ; Mizuta, Hiroshi ; Yamaguchi, Ken
Author_Institution :
Hitachi Ltd.
fYear :
1993
fDate :
14-15 May 1993
Firstpage :
30
Lastpage :
31
Keywords :
Charge carrier processes; Current-voltage characteristics; Degradation; Electrodes; Electron traps; Frequency dependence; Gallium arsenide; Hysteresis; MESFETs; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
Type :
conf
DOI :
10.1109/VPAD.1993.724710
Filename :
724710
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2108296
