• DocumentCode
    2108319
  • Title

    Robust Simulation Of GaAs Devices Using Energy Transport Model

  • Author

    So, Lydia L. ; Chen, Datong ; Yu, Zhiping ; Dutton, Robert W.

  • Author_Institution
    Stanford University
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    32
  • Lastpage
    33
  • Keywords
    Circuit simulation; Diodes; Electrons; Energy conservation; Energy loss; Equations; Fitting; Gallium arsenide; Robustness; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724711
  • Filename
    724711