DocumentCode
2108360
Title
Adaptive image segmentation for robust measurement of longitudinal brain tissue change
Author
Fletcher, E. ; Singh, Bawa ; Harvey, D. ; Carmichael, Owen ; DeCarli, C.
Author_Institution
Dept. of Neurology, Univ. of California, Davis, Davis, CA, USA
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
5319
Lastpage
5322
Abstract
We present a method that significantly improves magnetic resonance imaging (MRI) based brain tissue segmentation by modeling the topography of boundaries between tissue compartments. Edge operators are used to identify tissue interfaces and thereby more realistically model tissue label dependencies between adjacent voxels on opposite sides of an interface. When applied to a synthetic MRI template corrupted by additive noise, it provided more consistent tissue labeling across noise levels than two commonly used methods (FAST and SPM5). When applied to longitudinal MRI series it provided lesser variability in individual trajectories of tissue change, suggesting superior ability to discriminate real tissue change from noise. These results suggest that this method may be useful for robust longitudinal brain tissue change estimation.
Keywords
biological tissues; biomedical MRI; biomedical measurement; brain; image denoising; image segmentation; medical image processing; FAST method; SPM5 method; adaptive image segmentation; additive noise; adjacent voxels; brain tissue segmentation; edge operators; longitudinal MRI series; magnetic resonance imaging; robust longitudinal brain tissue change estimation; robust longitudinal brain tissue change measurement; synthetic MRI template; tissue compartments; tissue interfaces; tissue label dependency; topography modeling; Brain modeling; Image edge detection; Image segmentation; Magnetic resonance imaging; Noise; Robustness; Brain; Humans; Magnetic Resonance Imaging; Models, Theoretical;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6347195
Filename
6347195
Link To Document