DocumentCode :
2108360
Title :
Adaptive image segmentation for robust measurement of longitudinal brain tissue change
Author :
Fletcher, E. ; Singh, Bawa ; Harvey, D. ; Carmichael, Owen ; DeCarli, C.
Author_Institution :
Dept. of Neurology, Univ. of California, Davis, Davis, CA, USA
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
5319
Lastpage :
5322
Abstract :
We present a method that significantly improves magnetic resonance imaging (MRI) based brain tissue segmentation by modeling the topography of boundaries between tissue compartments. Edge operators are used to identify tissue interfaces and thereby more realistically model tissue label dependencies between adjacent voxels on opposite sides of an interface. When applied to a synthetic MRI template corrupted by additive noise, it provided more consistent tissue labeling across noise levels than two commonly used methods (FAST and SPM5). When applied to longitudinal MRI series it provided lesser variability in individual trajectories of tissue change, suggesting superior ability to discriminate real tissue change from noise. These results suggest that this method may be useful for robust longitudinal brain tissue change estimation.
Keywords :
biological tissues; biomedical MRI; biomedical measurement; brain; image denoising; image segmentation; medical image processing; FAST method; SPM5 method; adaptive image segmentation; additive noise; adjacent voxels; brain tissue segmentation; edge operators; longitudinal MRI series; magnetic resonance imaging; robust longitudinal brain tissue change estimation; robust longitudinal brain tissue change measurement; synthetic MRI template; tissue compartments; tissue interfaces; tissue label dependency; topography modeling; Brain modeling; Image edge detection; Image segmentation; Magnetic resonance imaging; Noise; Robustness; Brain; Humans; Magnetic Resonance Imaging; Models, Theoretical;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6347195
Filename :
6347195
Link To Document :
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