Title :
Stability criteria via S-parameters
Author_Institution :
Hewlett-Packard Co., Santa Rosa CA 95403, tel(707)577-4911, email: michalo@sr.hp.co
Abstract :
This paper presents a fresh look at applications of S-parameters to stability analysis. In particular, we present a simple example that proves that, contrary to the popular belief, the stability criterion SrSn > 1 is, in general, not true. We go back to Nyquist stability criterion to assure the proper interpretation of the product SrSn which is readily available in various CAE tools.
Keywords :
Circuit stability; Feedback circuits; Oscillators; Resonant frequency; Scattering parameters; Stability analysis; Stability criteria; Strontium; Tin; Transfer functions;
Conference_Titel :
Microwave Conference, 1995. 25th European
Conference_Location :
Bologna, Italy
DOI :
10.1109/EUMA.1995.337136
