DocumentCode
2108546
Title
Stability criteria via S-parameters
Author
Odyniec, Michal
Author_Institution
Hewlett-Packard Co., Santa Rosa CA 95403, tel(707)577-4911, email: michalo@sr.hp.co
Volume
2
fYear
1995
fDate
4-4 Sept. 1995
Firstpage
1113
Lastpage
1117
Abstract
This paper presents a fresh look at applications of S-parameters to stability analysis. In particular, we present a simple example that proves that, contrary to the popular belief, the stability criterion SrSn > 1 is, in general, not true. We go back to Nyquist stability criterion to assure the proper interpretation of the product SrSn which is readily available in various CAE tools.
Keywords
Circuit stability; Feedback circuits; Oscillators; Resonant frequency; Scattering parameters; Stability analysis; Stability criteria; Strontium; Tin; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1995. 25th European
Conference_Location
Bologna, Italy
Type
conf
DOI
10.1109/EUMA.1995.337136
Filename
4137350
Link To Document